yieldWerx
AI-powered semiconductor yield analytics for zero-defect manufacturing
Founded
N/A
Starting Price
Custom
Category
Manufacturing & ERP
Last updated April 17, 2026
About yieldWerx
yieldWerx is an enterprise semiconductor yield management platform that consolidates wafer probe, assembly, burn-in, and final-test data into a single unified repository. Leveraging AI and Industry 4.0 principles, it sifts through billions of data points to surface root causes of yield loss, automate alerts, and drive continuous process improvement. The platform supports STDF, ATDF, KLARF, WAT/PCM, XML, CSV, and other proprietary formats, and integrates with MES, ERP (SAP), and SPC systems. Deployable on-premise, in the cloud, or in a hybrid configuration, yieldWerx serves OSATs, IDMs, fabless design houses, and test equipment manufacturers. Founded by veterans from TI, Intel, Qualcomm, SMIC, and Amkor, the company has 15+ years of experience helping fabs reach zero-defect targets.
Pros & Cons
Pros
- Handles the full semiconductor supply chain from wafer probe to final test in one platform
- Deep automotive-grade PAT support (SPAT, DPAT, GDBN) built-in
- Flexible deployment: cloud, on-premise, or hybrid with setup in days to weeks
- Strong data ingestion supporting 100+ formats including all major ATE standards
- Responsive 24/7 support with phone, email, and chat options
Key Features
Unified Data Repository
Single source of truth consolidating data from MES, ERP (SAP), SPC, and ATE systems
AI Predictive Yield Analytics
Machine learning models identify yield loss patterns and predict failures before they escalate
Multi-Format Data Ingestion
Supports STDF, ATDF, KLARF, WAT/PCM, XML, CSV, and 100+ proprietary semiconductor test formats
Wafer Map Analysis
Interactive wafer maps with composite bin pattern visualization across hundreds of wafers simultaneously
Statistical Process Control (SPC)
Product and test-specific SPC rules with automated email alerts and stop notices to equipment and MES
Part Average Testing (PAT)
Full automotive-grade SPAT, DPAT, and multivariant PAT workflows for high-reliability industries
GDBN and Advanced Analysis
Good Die in Bad Neighborhood (GDBN, GDBN-Z), DOE, PCA, ANOVA, correlation, and T-Tests
Pricing
Enterprise
Custom
- Unified data repository
- AI yield analytics
- SPC with automated alerts
- PAT (SPAT, DPAT, multivariant)
- Wafer maps and bin pareto